Direct Shear Devices
Owed to our three direct shear devices manufactured by GIESA we are able to perform shear experiments at rates as low as 5.3 cm/yr with normal stresses up to 20 MPa. Obtained data are used to describe the slip behavior of the tested material.
Ring Shear Device
Confocal Laser Scanning Microscope
The newly acquired Confocal Laser Scanning Microscope by Carl Zeiss AG allows us to capture detailed images of fault planes produced by shear experiments. Moreover, topography maps can be generated enabling surface roughness analyses of fault planes. As several studies have suggested, fault surface roughness is a key factor in earthquake faulting. Results of these analyses can be directly connected with the frictional behavior of the respective sample and can lead to a more comprehensive description of slip behavior.